BER estimation for all-optical regenerators influenced by pattern effects

Svend Bischoff; B. Lading; Jesper Mørk

doi:10.1109/68.974152

BER estimation for all-optical regenerators influenced by pattern effects

Authors:

Bischoff, Svend ;
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Optoelectronics, Department of Photonics Engineering, Technical University of Denmark
Lading, B. ;
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unknown
Mørk, Jesper
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Department of Photonics Engineering, Technical University of Denmark

DOI:

10.1109/68.974152

Abstract:

An efficient method is presented for the estimation of the bit-error rate (BER) of a system employing all-optical regenerators influenced by pattern effects. We theoretically study noise accumulation and noise redistribution in long distance transmission systems employing a delayed interference signal wavelength converter for all-optical regeneration. The BER is studied for return-to-zero signals at bit rates of 2.5 Gb/s (no patterning) up to 40 Gb/s (strong patterning). The calculation of the BER is based on pattern dependent transfer functions, which may be obtained numerically or measured.

Type:

Journal article

Language:

English

Published in:

I E E E Photonics Technology Letters, 2002, Vol 14, Issue 1, p. 33-35

Main Research Area:

Science/technology

Publication Status:

Published

Review type:

Peer Review

Submission year:

2002

Scientific Level:

Scientific

ID:

11461097

BER estimation for all-optical regenerators influenced by pattern effects

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