Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.
Journal of Physics: Conference Series, 2011, Vol 326, Issue 1
Main Research Area:
17th International Conference on Microscopy of Semiconducting Materials, 2011