Volkov, V. S.3; Bozhevolnyi, S. I.3; Borel, Peter Ingo2; Frandsen, Lars Hagedorn2; Kristensen, Martin4
1 Nanophotonics, Department of Photonics Engineering, Technical University of Denmark2 Department of Photonics Engineering, Technical University of Denmark3 Aalborg University4 Department of Micro- and Nanotechnology, Technical University of Denmark
A scanning near-field optical microscope (SNOM) is used to directly map the propagation of light in a specially designed 50/50 photonic crystal (PC) Y-splitter fabricated on silicon-on-insulator (SOI) wafers. SNOM images are obtained for TE- and TM-polarized light in the wavelength range 1425-1570 nm. The recorded intensity distribution exhibit highly wavelength (and polarization) dependent intensity variations along the propagation direction, especially around the fork and bend regions. By comparing the SNOM images recorded in and after the PC Y-splitter area, the features of light distribution are analyzed for both polarizations.
Physica Status Solidi. C: Current Topics in Solid State Physics, 2005, Vol 2, Issue 12, p. 4087-4092