We present the results of an extensive study of X-ray reflectivities of dip lacquered and Au-coated Al foils. The measurements are performed at four different energies from 0.71 keV to 8.1 keV. The foils span a range of fabrication parameters. We show that two of three examined versions of a density variation model are able to explain the data. We find a strong dependence on the microroughness of thickness of the Au coating and of the Au deposition rates. We present data suggesting important correspondence between X-ray measurements and scanning tunneling microscopy measurements. We find no dependence on curing temperatures (70°C to 130°C). Finally, we have performed an energy scan of one of the foils in the range of 6 keV to 12 keV.
Proceedings of Spie, the International Society for Optical Engineering, 1990, Vol 1333, p. 257-268
Gold and Alloys--Coatings; Optical Variables Measurement; Telescopes; X-Rays--Reflection; Optical Coatings; A; T; X