In this work, a physical Schottky barrier diode model is presented. The model is based on physical parameters such as anode area, Ohmic contact area, doping profile from epitaxial (EPI) and substrate (SUB) layers, layer thicknesses, barrier height, specific contact resistance, and device temperature. The effects of barrier height lowering, nonlinear resistance from the EPI layer, and hot electron noise are all included for accurate characterization of the Schottky diode. To verify the diode model, measured I-V and C-V characteristics are compared with the simulation results. Due to the lack of measurement data for noise behaviors, simulated noise temperature is compared with the experimental data found from the open literature.
Proceedings of the 2013 Ieee International Wireless Symposium, 2013
Computing and Processing; Schottky barrier diode; Physical based model; Barrier height lowering; Hot-electron noise