1 Department of Energy Conversion and Storage, Technical University of Denmark 2 Imaging and Structural Analysis, Department of Energy Conversion and Storage, Technical University of Denmark 3 Risø National Laboratory for Sustainable Energy, Technical University of Denmark
In an ultra-high vacuum scanning electron microscope, the edged branches of amorphous carbon film (∼10 nm thickness) can be continuously extended with an eye-identifying speed (on the order of ∼1 nm/s) under electron beam. Such unusual mobility of amorphous carbon may be associated with deformation promoted by the electric field, which resulted from an inner secondary electron potential difference from the main trunk of carbon film to the tip end of branches under electron beam. This result demonstrates importance of applying electrical effects to modify properties of carbon materials. It may have positive implications to explore some amorphous carbon as electron field emission device. SCANNING 35: 261-264, 2013. © 2012 Wiley Periodicals, Inc.
Scanning, 2013, Vol 35, Issue 4, p. 261-264
SEM; Amorphous carbon; Electron beam; Secondary electron; Extensibility
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