1 Department of Photonics Engineering, Technical University of Denmark2 Department of Micro- and Nanotechnology, Technical University of Denmark3 Silicon Microtechnology, Department of Micro- and Nanotechnology, Technical University of Denmark4 Fiber Sensors and Supercontinuum Generation, Department of Photonics Engineering, Technical University of Denmark
Focused ion beam (FIB) is a highly versatile technique which helps to enable next generation of lab-on-fiber sensor technologies. In this paper, we demonstrate the use application of FIB to precisely mill the fiber taper and end facet of both conventional single mode fiber (SMF) and photonic crystal fiber (PCF). Using this technique we fabricate a highly compact fiber-optic Fabry-Pérot (FP) refractive index sensor near the tip of fiber taper, and a highly sensitive in-line temperature sensor in PCF. We also demonstrate the potential of using FIB to selectively fill functional fluid into desired air holes of PCF.
Proceedings of Spie, the International Society for Optical Engineering, 2012, Vol 8421
Fiber sensor; Focused Ion Beam; Lab-on-fiber
Main Research Area:
22nd International Conference on Optical Fiber Sensors (OFS 2012)