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Dynamic Characterization and Impulse Response Modeling of Amplitude and Phase Response of Silicon Nanowires

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Authors:
  • Cleary, Ciaran S. ;
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    University College Cork
  • Ji, Hua ;
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    Department of Photonics Engineering, Technical University of Denmark
  • Dailey, James M. ;
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    University College Cork
  • Webb, Roderick P. ;
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    University College Cork
  • Manning, Robert J. ;
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    University College Cork
  • Galili, Michael ;
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    Orcid logo0000-0002-3514-8510
    Department of Photonics Engineering, Technical University of Denmark
  • Jeppesen, Palle ;
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    Department of Photonics Engineering, Technical University of Denmark
  • Pu, Minhao ;
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    Department of Photonics Engineering, Technical University of Denmark
  • Yvind, Kresten ;
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    Orcid logo0000-0001-8013-1606
    Department of Photonics Engineering, Technical University of Denmark
  • Oxenløwe, Leif Katsuo
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    Orcid logo0000-0001-6013-3639
    Department of Photonics Engineering, Technical University of Denmark
DOI:
10.1109/JPHOT.2013.2246560
Abstract:
Amplitude and phase dynamics of silicon nanowires were measured using time-resolved spectroscopy. Time shifts of the maximum phase change and minimum amplitude as a function of pump power due to saturation of the free-carrier density were observed. A phenomenological impulse response model used to fit the experimental data indicated that the free-carrier lifetime was between $7.5 \leq \tau_{\rm fc} \leq 16.2\ \hbox{ns}$, and the two-photon absorption coefficient and the Kerr coefficient were $3 \times 10^{-12}\ \hbox{m.W}^{-1}$ and $4 \times 10^{-18}\ \hbox{m}^{2}.\hbox{W}^{-1}$, respectively, for silicon nanowires with lengths varying from 3.6 to 14.9 mm.
Type:
Journal article
Language:
English
Published in:
I E E E Photonics Journal, 2013, Vol 5, Issue 2
Keywords:
Silicon nanowire; Pump–probe spectroscopy; Two-photon absorption (TPA); Free-carrier absorption (FCA)
Main Research Area:
Science/technology
Publication Status:
Published
Review type:
Peer Review
Submission year:
2014
Scientific Level:
Scientific
ID:
239065939

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