Visible Light Emission from Atomic Scale Patterns Fabricated by the Scanning Tunneling Microscope

C. Thirstrup; M. Sakurai; Kurt Stokbro; M. Aono

doi:10.1103/PhysRevLett.82.1241

Visible Light Emission from Atomic Scale Patterns Fabricated by the Scanning Tunneling Microscope

Authors:

Thirstrup, C. ;
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The Institute of Chemical and Physical Research
Sakurai, M. ;
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The Institute of Chemical and Physical Research
Stokbro, Kurt ;
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Department of Micro- and Nanotechnology, Technical University of Denmark
Aono, M.
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The Institute of Chemical and Physical Research

DOI:

10.1103/PhysRevLett.82.1241

Abstract:

Scanning tunneling microscope (STM) induced light emission from artificial atomic scale structures comprising silicon dangling bonds on hydrogen-terminated Si(001) surfaces has been mapped spatially and analyzed spectroscopically in the visible spectral range. The light emission is based on a novel mechanism involving optical transitions between a tip state and localized states on the sample surface. The wavelength of the photons can be changed by the bias voltage of the STM. The spatial resolution of the photon maps is as good as that of STM topographic images and the photons are emitted from a quasipoint source with a spatial extension similar to the size of a dangling bond. [S0031-9007(98)08376-8].

Type:

Journal article

Language:

English

Published in:

Physical Review Letters, 1999, Vol 82, Issue 6, p. 1241-1244

Keywords:

STATES; MANIPULATION; SURFACE; NANOMETER-SCALE; DESORPTION; SILICON; SI(100); PHOTON-EMISSION; STM; INVERSE PHOTOEMISSION

Main Research Area:

Science/technology

Publication Status:

Published

Review type:

Peer Review

Submission year:

1999

Scientific Level:

Scientific

ID:

2185782369

Visible Light Emission from Atomic Scale Patterns Fabricated by the Scanning Tunneling Microscope

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