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Visible Light Emission from Atomic Scale Patterns Fabricated by the Scanning Tunneling Microscope

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Authors:
  • Thirstrup, C. ;
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    The Institute of Chemical and Physical Research
  • Sakurai, M. ;
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    The Institute of Chemical and Physical Research
  • Stokbro, Kurt ;
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    Department of Micro- and Nanotechnology, Technical University of Denmark
  • Aono, M.
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    The Institute of Chemical and Physical Research
DOI:
10.1103/PhysRevLett.82.1241
Abstract:
Scanning tunneling microscope (STM) induced light emission from artificial atomic scale structures comprising silicon dangling bonds on hydrogen-terminated Si(001) surfaces has been mapped spatially and analyzed spectroscopically in the visible spectral range. The light emission is based on a novel mechanism involving optical transitions between a tip state and localized states on the sample surface. The wavelength of the photons can be changed by the bias voltage of the STM. The spatial resolution of the photon maps is as good as that of STM topographic images and the photons are emitted from a quasipoint source with a spatial extension similar to the size of a dangling bond. [S0031-9007(98)08376-8].
Type:
Journal article
Language:
English
Published in:
Physical Review Letters, 1999, Vol 82, Issue 6, p. 1241-1244
Keywords:
STATES; MANIPULATION; SURFACE; NANOMETER-SCALE; DESORPTION; SILICON; SI(100); PHOTON-EMISSION; STM; INVERSE PHOTOEMISSION
Main Research Area:
Science/technology
Publication Status:
Published
Review type:
Peer Review
Submission year:
1999
Scientific Level:
Scientific
ID:
2185782369

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