1 Department of Physics, Technical University of Denmark2 Electric Power Engineering, Department of Electrical Engineering, Technical University of Denmark3 Department of Electrical Engineering, Technical University of Denmark4 unknown5 Department of Applied Mathematics and Computer Science, Technical University of Denmark
We measured spectral noise density in YBCO symmetric bicrystal Josephson junctions on sapphire substrates at bias voltages up to 100 mV and T 4.2 K. Normal state resistance of the Josephson junctions, R-N = 20-90 Omega and ICRN up to 2.2 mV have been observed in the experimental samples. Noise measurements were carried out within frequency bands of 1-2 GHz and 0.3-300 kHz. At bias voltages 10 less than or equal to V less than or equal to 60 mV a linear voltage dependence of noise power has been registered, while at V less than or equal to 5 mV a noticeable noise rise has been observed. The latter may explain the experimentally measured linewidth broadening of Josephson oscillations at mm and submm wave frequencies in high-Tc superconducting junctions. Experimental results are discussed in terms of bound states existing at surfaces of d-wave superconducting electrodes.
Ieee Transactions on Applied Superconductivity, 2003, Vol 13, Issue 2, p. 610-613