1 Department of Micro- and Nanotechnology, Technical University of Denmark2 unknown
We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index structures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10(-5)-10(-3)) with submicrometer lateral resolution, The proposed method yields detailed information about the topography and index profiles of UV-written waveguides.
I E E E Photonics Technology Letters, 1998, Vol 10, Issue 6, p. 848-850
scanning near-field optical microscopy (SNOM); silica-on-silicon; ultraviolet-induced index changes (photosensitivity)